Please Register Online

You are kindly invited to:
Sub-Nyquist Sampling (Xampling) - Smart Sampling
Wednesday, March 21, 2012, 8:30 - 14:25
Auditorium 280, 2nd floor, Electrical Engineering Building, Technion

Launching new area of activity in the EE Department, Technion


Sub-Nyquist Sampling (Xampling) - Smart Sampling



The activity will be based on research performed by a team led 


by Prof. Yonina Eldar.

Activities include research and implementation of demo systems in cooperation with the High Speed Digital Systems Laboratory at the Department of Electrical Engineering.



08:30 - 09:00

Registration and refreshments

09:00 - 09:10

Prof. Adam Shwartz
Dean, EE Department, Technion

09:10 - 09:30

The Smart Sampling Lab @ HSDSL slides available
Prof. Yonina Eldar
EE Department, Technion

09:30 - 10:15

Defying Nyquist in Analog-to-Digital Conversion- slides are available
Prof. Yonina Eldar
EE Department, Technion

10:15 - 10:45

Sparsity-Based Sub-Wavelength Imaging
Prof. Moti Segev
Physics Department and Solid State Institute, Technion

10:45 - 11:00

Coffee Break

11:00 - 11:20

Sub-Nyquist Sampling of Wideband Signals- Slides are available
Deborah Cohen
EE Department, Technion

11:20 - 11:40

Compressed Beamforming in Ultrasound Imaging
Noam Wagner
EE Department, Technion

11:40 - 12:00

Nonlinear Sampling with Application to Imaging
Tomer Michaeli
EE Department, Technion

12:00 - 12:30

Live Demonstration: Real-Time Sub-Nyquist Wideband Sensing
Rolf Hilgendorf
EE Department, Technion

12:30 - 13:15

Light Lunch

13:15 - 13:25

The EE Department and Industry - Collaboration Mechanisms
Prof. Yitzhak (Tsahi) Birk
EE Department, Technion

13:25 - 13:45

Test and Measurement for Sub-Nyquist Sampling
James Kimery
Director of Marketing RF / Communications / SDR
National Instruments

13:45 - 14:05

Wideband Front End: An Automotive Mobile Wireless Device Perspective
Dr. Kobi Scheim
General Motors

14:05 - 14:25

Simulation Platform for Signal Processing and Analysis of UWB Radar and Multi Fading Channels
Haim Spiegel
Agilent Technologies

?What is Sub-Nyquist Sampling  

We live in an analog world, but data processing is usually performed by digital computers.
The transition from the analog (continuous time) to the digital world is called sampling. 

In most analog-to-digital converters (ADCs) today, sampling is based on the Shannon-Nyquist theorem, which requires sampling at a rate that is at least twice the highest signal frequency.

As the bandwidth of the signal increases, it demands the increase in sampling frequency, which raises a number of critical issues that affect system design:

  • There is a need for expensive wideband ADCs which require excessive hardware solutions and consume a lot of power.
  • Computer systems need more memory and more computing power in order to process the sampled data. In many cases, much of the sampled information is compressed and reduced in later stages of the processing.

Sub-Nyquist sampling offers a new way of smart and effective sampling of wideband signals by performing analog preprocessing prior to sampling. The idea is to exploit the same structure that is used in the digital chain in order to drastically reduce the sampling rate and only sample the information in the signal that is actually needed. Thus, instead of sampling at a high rate and then compressing the data, it is possible to sample the signal at a low rate to begin with. Low sampling rate also enables low-rate digital processing and reduces required system memory and power.

This technology has many potential applications in a large variety of fields such as communications, radar systems, medical imaging, optical systems, super-resolution microscopy and more.


At the event we will present algorithms and systems developed in the area of sub-Nyquist sampling.



Recent review articles:

  1. M. Mishali and Y. C. Eldar, "Sub-Nyquist Sampling: Bridging Theory and Practice", IEEE Signal Processing Magazine, vol. 28, no. 6, pp. 98-124, Nov. 2011.
  2. Skipping over Nyquist  (in Hebrew)  - מדלגים על נייקוויסט
  3. M. Mishali and Y. C. Eldar, "Xampling: Compressed Sensing for Analog Signals", Compressed Sensing: Theory and Applications, Edited by Y. C. Eldar and G. Kutyniok, Cambridge University Press, 2012.


Additional information on Xampling can be found at Prof. Yonina Eldar’s website.

For further information on Xampling demo systems click here.


We look forward to seeing you at the event.

Please feel free to forward this invitation within your organization.


Best regards,


Yonina Eldar



For more information please contact Suzie Eid:

Email:, 972 4 829-5925. Ina Rivkin Email:, 972 4 829-4789


Registration Form


Technion MAP


Please Register Online